Course Name: Scanning Electron / Ion / Probe Microscopy in Materials Characterization

Course abstract

This course ?Scanning Electron / Ion / Probe Microscopy in Materials Characterization? will provides in- depth understanding on three different microscopy techniques to students as well as engineers, technicians, and researchers (material and biological scientists). These three scanning microscopy techniques are widely used to obtain the surface morphology of solid materials (primarily) at nanometer range. The topics will cover not only basic principles of these techniques and different parameters that affect the image quality but also preparation of different types of samples and the interpretation of results/data. The advancements to these microscopic techniques will be briefed with examples.


Course Instructor

Media Object

Prof. Debabrata Pradhan

The instructor of this course Debabrata Pradhan has been serving as Assistant and Associate Professor at Materials Science Centre, IIT Kharagpur since 2010. He received PhD degree from IIT Bombay, and did postdoctoral research at Tamkang University, Taiwan, for 2 years and University of Waterloo, Canada, for 4 years. He also served Electron Microscopy facility at SAIF, IIT Bombay, for a year after completion of PhD work. He has received Adani Award for Excellence in Teaching Physical Chemistry to the B. Tech. students at IIT-Bombay (2001-2002), MRSI Medal 2019 by MRS, India, in recognition of significant contributions to the field of Materials Science and Engineering, and Faculty Excellence Award 2019 by IIT Kharagpur for outstanding contributions towards Teaching, Research, and Institutional Development. He has published more than 130 research papers, 1 book, 2 book chapters, and 2 patents. His current h-index is 40 with citations >5500.
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Teaching Assistant(s)

No teaching assistant data available for this course yet
 Course Duration : Jan-Apr 2021
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 Syllabus
 Enrollment : 18-Nov-2020 to 15-Feb-2021
 Exam registration : 15-Jan-2021 to 12-Mar-2021
 Exam Date : 24-Apr-2021

Enrolled

526

Registered

37

Certificate Eligible

8

Certified Category Count

Gold

0

Silver

0

Elite

1

Successfully completed

7

Participation

16

Success

Elite

Silver

Gold




Legend

AVERAGE ASSIGNMENT SCORE >=10/25 AND EXAM SCORE >= 30/75 AND FINAL SCORE >=40
BASED ON THE FINAL SCORE, Certificate criteria will be as below:
>=90 - Elite + Gold
75-89 -Elite + Silver
>=60 - Elite
40-59 - Successfully Completed

Final Score Calculation Logic

  • Assignment Score = Average of best 6 out of 8 assignments.
  • Final Score(Score on Certificate)= 75% of Exam Score + 25% of Assignment Score
Scanning Electron / Ion / Probe Microscopy in Materials Characterization - Toppers list

SACHIN KUMAR 60%

SANT LONGOWAL INSTITUTE OF ENGINEERING AND TECHNOLOGY

Enrollment Statistics

Total Enrollment: 526

Registration Statistics

Total Registration : 37

Assignment Statistics



Assignment

Exam score

Final score

Score Distribution Graph - Legend

Assignment Score: Distribution of average scores garnered by students per assignment.
Exam Score : Distribution of the final exam score of students.
Final Score : Distribution of the combined score of assignments and final exam, based on the score logic.